X-ray reflectivity and surface energy analyses of the physical and electrical properties of α-IGZO/GZO double active layer thin film transistors

Jia Ling Wu, Han Yu Lin, Bo Yuan Su, Yu Cheng Chen, Sheng Yuan Chu, Ssu Yin Liu, Chia Chiang Chang, Chin Jyi Wu

研究成果: Article同行評審

18 引文 斯高帕斯(Scopus)

指紋

深入研究「X-ray reflectivity and surface energy analyses of the physical and electrical properties of α-IGZO/GZO double active layer thin film transistors」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds