摘要
The authors report the growth of high density ternary Zn1-x Cdx Se (x=0.1,0.3) nanowires on an oxidized Si(100) substrate by molecular beam epitaxy and the fabrication of ZnCdSe nanowire photodetectors. It was found that the as-grown ZnCdSe nanowires exhibited mixture of cubic zinc-blende and hexagonal wurtzite structures. It was also found that the average diameters for the Zn0.9 Cd0.1 Se and Zn 0.7 Cd0.3 Se nanowires were 36.0 and 70.6 nm, respectively, while the average lengths of Zn0.9 Cd0.1 Se and Zn0.7 Cd0.3 Se nanowires were both around 1 μm. Furthermore, it was found that the turn-on and turn-off time constants of the fabricated photodetectors were both less than 3 s.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 613-616 |
| 頁數 | 4 |
| 期刊 | Journal of Vacuum Science and Technology B |
| 卷 | 28 |
| 發行號 | 3 |
| DOIs | |
| 出版狀態 | Published - 2010 5月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 儀器
- 製程化學與技術
- 表面、塗料和薄膜
- 電氣與電子工程
- 材料化學
指紋
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